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  • SEMI Releases PVD Targets Global Purity Verification White Paper 2.0
    PVD Targets
    SEMI Releases PVD Targets Global Purity Verification White Paper 2.0
    SEMI PVD Targets Global Purity Verification White Paper 2.0 now accepts CNAS-accredited ISO 14577 nanoindentation data—accelerating purity validation for Ta, Cu & TiAl sputtering targets exported from China.

    Author

    Dr. Aris Nano

    Filed

    2026/05/09
  • PVD Targets
    SEMI-ASML PVD Targets White Paper Accepts CNAS Nanoindentation Reports
    SEMI-ASML PVD Targets White Paper accepts CNAS nanoindentation reports—boost global market access for Chinese sputtering target suppliers. Learn implications now.

    Author

    Dr. Aris Nano

    Filed

    2026/05/08
  • Thin-Film Deposition costs hidden in chamber downtime
    PVD Targets
    Thin-Film Deposition costs hidden in chamber downtime
    Thin-Film Deposition costs often hide in chamber downtime. Learn how to spot hidden ROI risks, reduce output loss, and make smarter budget and supplier decisions.

    Author

    Dr. Aris Nano

    Filed

    2026/04/30
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